Date of Original Version
2003
Type
Article
Published In
Journal of Crystal Growth Volume 249, Issues 3–4, March 2003, Pages 437–444
Abstract or Table of Contents
Cross-sectional scanning tunneling microscopy has been used to study variations in the source gas switching sequences in lattice-matched InGaAs/InP heterostructures grown by chemical beam epitaxy. Using finite element analysis, changes in well–barrier interface strain can be understood in terms of As/P exchange and As memory effect in the growth chamber. Results from annealed samples indicate a greater interdiffusion of group-V species than group-III species.