Date of Original Version

2002

Type

Conference Proceeding

Abstract or Description

Chemically assembled electronic nanotechnology (CAEN) is a promising alternative to CMOS-based computing. However, CAEN-based circuits are expected to have huge defect densities. To solve this problem CAEN can be used to build reconfigurable fabrics which, assuming the defects can be found, are inherently defect tolerant. In this paper, we propose a scalable testing methodology for finding defects in reconfigurable devices.

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